Gold nanoparticles on Ge wafer have been fabricated by a one-step green reaction.
The SERS enhancement factor of Rhodamine 6G reached 4.5 × 106.
The relative standard deviation of SERS signals is less than 8%.
Highly sensitive, large-area and uniform surface-enhanced Raman scattering (SERS) substrates based on gold nanoparticles grown on Ge wafer have been fabricated by a one-step green reaction. The results showed that these substrates exhibited admirable performance in the low concentration detection (1 × 10−7 M) of Rhodamine 6G with the enhancement factor of 4.5 × 106 and remarkable uniformity with relative standard deviation less than 8%. The uniform enhancement was also obtained in the aqueous detection of malachite green. During the experiments, the Raman spectra were recorded in the solution to pursue the uniformity, reproducibility and stability of signals.
Plastically deformed Ge-crystal wafers that have the cylindrical shape with a large curvature were characterized by neutron diffraction. The box-type rocking curve of Bragg reflection with the angular width of Γbox≃2° in FWHM, which is observable in the monochromatic neutron diffraction, results in an enhancement in the angle-integrated intensity (Iθ). Besides, Iθ efficiently increases by stacking such Ge wafers. In the course of white neutron diffraction, the reflected-beam width near the focus point becomes sharper than the initial beam width. Further, the dependence of the horizontal beam width on the distance between the sample and detector is quantitatively explained by taking account of the large Γbox, the small mosaic spread of η≃0.1°, and the thickness of the wafers. On the basis of these characterizations, use of plastically deformed Ge wafers as elements for high-luminance neutron monochromator is proposed.